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US Patent Issued to KLA on July 28 for "Diffraction-based illumination sampling" (German Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,155, issued on July 28, was assigned to KLA Corp. (Milpitas, Calif.). "Diffraction-based illumination sampling" was invented by Florian Mel... Read More


US Patent Issued to Sony Semiconductor Solutions on July 28 for "Light detection apparatus and method of manufacturing the same" (Japanese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,156, issued on July 28, was assigned to Sony Semiconductor Solutions Corp. (Kanagawa, Japan). "Light detection apparatus and method of manu... Read More


US Patent Issued to PsiQuantum on July 28 for "Superconducting photon detector" (California Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,157, issued on July 28, was assigned to PsiQuantum Corp. (Palo Alto, Calif.). "Superconducting photon detector" was invented by Mark Thomps... Read More


US Patent Issued to Artilux on July 28 for "Optical signal receiving circuit used in an optical sensing apparatus" (Taiwanese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,158, issued on July 28, was assigned to Artilux Inc. (Menlo Park, Calif.). "Optical signal receiving circuit used in an optical sensing app... Read More


US Patent Issued to Emcode Photonics on July 28 for "Multiple input spectrometer" (Massachusetts Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,159, issued on July 28, was assigned to Emcode Photonics LLC (Andover, Mass.). "Multiple input spectrometer" was invented by Shrenik Deliwa... Read More


US Patent Issued to COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, CENTRALESUPELEC, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, UNIVERSITE PARIS-SACLAY on July 28 for "Method for the energy calibration of a spectrometry detector" (French Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,160, issued on July 28, was assigned to COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES (Paris), CENTRALESUPELEC (Gif-sur-yve... Read More


US Patent Issued to KONICA MINOLTA on July 28 for "Optical characteristic measuring apparatus, wavelength shift correcting apparatus, wavelength shift correction method, and program" (Japanese Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,161, issued on July 28, was assigned to KONICA MINOLTA INC. (Tokyo). "Optical characteristic measuring apparatus, wavelength shift correcti... Read More


US Patent Issued to LITE-ON SINGAPORE on July 28 for "Offset voltage compensation circuit and isolation amplifier device including the same" (Singaporean Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,162, issued on July 28, was assigned to LITE-ON SINGAPORE PTE. LTD. (Singapore). "Offset voltage compensation circuit and isolation amplifi... Read More


US Patent Issued to Huawei Technologies'Co., 'Ltd.' on July 28 for "Wavelength measurement chip and wavelength measurement system" (Chinese, Japanese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,163, issued on July 28, was assigned to Huawei Technologies'Co.'Ltd.' (Shenzhen, China). "Wavelength measurement chip and wavelength measur... Read More


US Patent Issued to The Regents of The University of Michigan on July 28 for "Broadband phase-modulated Fourier transform spectroscopy" (Michigan Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,164, issued on July 28, was assigned to The Regents of The University of Michigan (Ann Arbor, Mich.). "Broadband phase-modulated Fourier tr... Read More